By Pietro Giuseppe Gucciardi, Guillaume Bachelier (auth.), Bharat Bhushan, Harald Fuchs, Masahiko Tomitori (eds.)
The good fortune of the Springer sequence utilized Scanning Probe tools I–VII and the swiftly increasing actions in scanning probe improvement and functions around the globe made it a normal step to gather additional speci c leads to the elds of improvement of scanning probe microscopy ideas (Vol. VIII), characterization (Vol. IX), and biomimetics and commercial functions (Vol. X). those 3 volumes supplement the former set of volumes below the topic themes and provides perception into the hot paintings of major experts of their respective elds. Following the culture of the sequence, the chapters are prepared round strategies, characterization and biomimetics and commercial functions. quantity VIII specializes in novel scanning probe thoughts and the certainty of tip/sample interactions. issues comprise close to eld imaging, complex AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever structures, mixtures of AFM sensors and scanning electron and ion microscopes, calibration equipment, frequency modulation AFM for software in beverages, Kelvin probe strength microscopy, scanning capacitance microscopy, and the dimension of electric shipping houses on the nanometer scale. Vol. IX specializes in characterization of fabric surfaces together with structural in addition to neighborhood mechanical characterization, and molecular structures. the quantity covers a huge spectrum of STM/AFM investigations together with fullerene layers, strength spectroscopy for probing fabric homes often, organic lms .and cells, epithelial and endothelial layers, clinical comparable platforms resembling amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical homes ofpolymernanostructures, technical polymers, and close to eld optics.
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Additional resources for Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques
301 Development of MOEMS Devices and Their Reliability Issues Bharat Bhushan, Huiwen Liu . . . . . . . . . . . 349 Subject Index . . . . . . . . . . . . . . . . . . it Guillaume Bachelier Laboratoire de Spectrométrie Ionique et Moléculaire (LASIM) Université Claude Bernard – Lyon 1, Bât. A. fr Bharat Bhushan Nanotribology Lab for Information Storage and MEMS/NEMS (NLIM) The Ohio State University 201 W. fr Anne Marie Bonnot LEPES 25 av. fr P. es Eugenio Cefalì Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate Università di Messina Salita Sperone n.
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